| 摘要 |
PURPOSE:To discriminate the presence of the element having the specific X-ray, by using the average value of X-ray intensity measured at the location of the wavelength regarded as the background at the both sides of the peak position and the peak position of specific X-ray spectrum. CONSTITUTION:To the specific X-ray intensity spectrum produced from inspected test piece, the average value of n-time measurement of intensity at the wavelengths lambdaa-lambdab (where lambdao is the wavelength of peak position of spectrum, and lambdaa-lambdab is the wavelength area near lambdao) is taken as Ip, the intensity is measured once at the wavelengths lambdad, lambdac (the wavelengths apart from lambdao from twice or more the half- value of the spectrum, accordingly can be regarded as the background of the spectrum) and the mean value is taken as IB, then the statistical variation of Ip (standard deviation) delta is expressed in equation I. Next, the relation of equations II, III, and IV is satisfied, then the objective element (the element producing the said specific X-ray) is discriminated respectively sure, possible and a little possible for the presence. |
