发明名称 METHOD OF INSPECTING THERMAL HEAD ARRAY
摘要 PURPOSE:To enable the easy and quick inspection of a circuit of a thermal head array through the construction in which recording is performed with a switching element controlled to be ON condition and the current value at that time being caused to correspond to each other. CONSTITUTION:Contacts 70 and 71 are connected to each other by means of a changeover switch 7. Signals representing e logic '0' are sent into every bit of a shift register 2. A signal representing a logic '1' is supplied to a first bit through the data input 20 of the shift register 2, and afterwards, the data input 20 is maintained to be the logic '0'. Only D1 of a driver 4 is turned ON through a latch signal input 30 and strobe signal input 40. Only D2 of the driver 4 is put ON through a clock input 21, the latch signal input 30 and the strobe signal input 40. Similarly, D3, D4, D5,...Dn of the driver 4 are turned ON in order. Another clock input into the shift register 2 is lastly made so as to convert the logic of every bit of the shift register 2 to the logic '0'. This operation is repeated by connecting the contacts 70 and 72 of the changeover switch 7. Necessary analysises are conducted on the basis of the current values of a memory.
申请公布号 JPH01171867(A) 申请公布日期 1989.07.06
申请号 JP19870331363 申请日期 1987.12.25
申请人 GRAPHTEC CORP 发明人 TOYOSAWA TAKESHI;FUJITA YOSHINOBU
分类号 B41J2/35 主分类号 B41J2/35
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