| 摘要 |
PURPOSE:To make it possible to measure the magnetic strain constant correctly by a compact device by causing different magnetization on samples at a position where the variation of the diffraction strength against the variation of the diffraction angle of X-rays is drastic and seeking the variation of the grid constant. CONSTITUTION:X-rays emitted from an X-ray tube 1 are converted into beams through a slit 2, and diffracted by a crystal on a goniometer 3 and by a smaple 6 on a gonimeter 5. The X-rays are detected by a scintillation counter 7, and their pulse heights are analyzed by a pulse height analyser 8. The X-rays are further recorded as diffraction spectra by an x-t(theta) recorder 9. In this case, the diffraction angle theta of the sample 6 is continuously varied to obtain the variation of the diffraction angle against the diffraction angle, and the variation of the grid constant is obtained from the variation of the diffraction strength in a position where the inclination of the diffraction spectrum becomes steep to obtain the magnetic strain constant. |
