发明名称 SEE-THROUGH MASK BLANK
摘要 PURPOSE:To form a translucent pattern with a simple stage so that the fine pattern having high accuracy is obtd. by providing the oxide film layer of molybdenum silicide on a light transparent substrate by a sputtering method, thereby forming a see-through mask blank. CONSTITUTION:The see-through mask blank 10 is produced by forming the oxide film layer of the molybdenum silicide on the light transparent substrate 1 by the sputtering method utilizing gaseous argon contg. gaseous oxygen. The ratio to the oxygen partial pressure in the gaseous argon to the total pressure is designated as gamma and the power of the sputtering as Qkw and the sputtering is preferably so executed that the value satisfies the inequality gamma<=9/25Q. The translucent pattern is thus formed by the simple stage by subjecting the oxide film layer 6 of the molybdenum silicide to dry etching by using the resist pattern. The fine pattern having the high accuracy is thus obtd.
申请公布号 JPH01191146(A) 申请公布日期 1989.08.01
申请号 JP19880016135 申请日期 1988.01.26
申请人 MITSUBISHI ELECTRIC CORP 发明人 CHIBA AKIRA
分类号 G03F1/00;G03F1/50;G03F1/54;H01L21/027;H01L21/30 主分类号 G03F1/00
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