发明名称 SURFACE REFLECTION MEASURING APPARATUS
摘要 PURPOSE:To obtain the absolute value of the reflection factor through a highly accurate measurement of a test piece having a high reflection rate by performing an energy damping of the luminous flux on the test piece exponentialwise while the luminous flux is reflected on the surface of the test piece at more than the specified times. CONSTITUTION:In absence of object S to be measured, the standard luminous flux passes through the route of Mirror M4-M5-M6. In the presence of the object S, the luminous flux projected to the test piece passes through the route of S-M4-S-M5-S- M6-S. As a result, the test piece luminous flux is exponentially damped in the energy. This makes the test piece luminous flux larger in the difference of the energy than the standard luminous flux, allowing highly accurate measurement.
申请公布号 JPS5599045(A) 申请公布日期 1980.07.28
申请号 JP19790006914 申请日期 1979.01.24
申请人 NIPPON BUNKO KOGYO KK 发明人 KIMURA SHIGEYUKI
分类号 G01N21/55;(IPC1-7):01N21/55 主分类号 G01N21/55
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