发明名称 Photolacquer structuring for lift=off technique - involves applying full face exposure through glass after UV light exposure
摘要 To produce very fine photolacquer structures in the mfr. of semiconductors, so-called hard masks are applied for irradiating the lacquer layer by UV light. The masked side of the substrate then receives a sputtered or vapour-deposited metal layer, followed by a treatment with solvents to remove the photoresist. After the usual exposure and before the development, a second brief exposure is carried out through the glass carrier over the full area. This ensures a satisfactory lift-off for the metal layer above the photolacquer structures.
申请公布号 DE2854045(A1) 申请公布日期 1980.07.17
申请号 DE19782854045 申请日期 1978.12.14
申请人 SIEMENS AG 发明人 TRAUSCH,GUENTER-ELMAR,DIPL.-ING.
分类号 G03F1/68;G03F7/20 主分类号 G03F1/68
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