METHOD OF MEASURING THE MODULUS AND PHASE OF REFLECTION COEFFICIENT OF SEMICONDUCTOR AND DIELECTRIC MATERIALS,申请号SU19762338929-传众专利搜索

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发明名称	METHOD OF MEASURING THE MODULUS AND PHASE OF REFLECTION COEFFICIENT OF SEMICONDUCTOR AND DIELECTRIC MATERIALS
摘要
申请公布号	SU748283(A1)	申请公布日期	1980.07.15
申请号	SU19762338929	申请日期	1976.03.26
申请人	KH G UNIV IM.A.M.GORKOGO	发明人	EPISHIN VLADIMIR A,SU;BAKHTIN VITALIJ D,SU;YAGUDIN GADIJ KH,SU;DUNAEVSKIJ GRIGORIJ E,SU
分类号	G01R27/06;(IPC1-7):G01R27/06	主分类号	G01R27/06
代理机构		代理人
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