APPARATUS FOR MEASURING TRANSIENT PROCESS DURATION IN SYSTEMS FOR CONTROL OF CRT ELECTRON BEAM,申请号SU19782595986-传众专利搜索

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发明名称	APPARATUS FOR MEASURING TRANSIENT PROCESS DURATION IN SYSTEMS FOR CONTROL OF CRT ELECTRON BEAM
摘要
申请公布号	SU744783(A1)	申请公布日期	1980.06.30
申请号	SU19782595986	申请日期	1978.03.29
申请人	KUBILIS AUGUSTAS M,SU;POLESSKIJ YURIJ ,SU	发明人	KUBILIS AUGUSTAS M,SU;POLESSKIJ YURIJ ,SU
分类号	H01J31/60;(IPC1-7):H01J31/60	主分类号	H01J31/60
代理机构		代理人
主权项
地址

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