发明名称 Admittance sensing probe having multiple sensing elements
摘要 A single, elongated admittance sensing probe element comprises an elongated probe structure including a conductive level measuring probe electrode and a conductive composition probe electrode longitudinally spaced from the level measuring probe electrode closer to one end of the probe. A conductive shield extends between the level measuring and composition probe elements and beyond the composition probe element at the end of the probe. The entire structure is enclosed within an insulating material. In one embodiment, a cylindrical ground electrode or shield is mounted around the probe structure.
申请公布号 US4208909(A) 申请公布日期 1980.06.24
申请号 US19780963300 申请日期 1978.11.24
申请人 DREXELBROOK CONTROLS, INC. 发明人 KRAMER, L JONATHAN;MALTBY, FREDERICK L
分类号 G01F23/26;G01N27/07;G01R27/22;(IPC1-7):G01F23/26 主分类号 G01F23/26
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