发明名称 |
FET ONE-DEVICE MEMORY CELLS WITH TWO LAYERS OF POLYCRYSTALLINE SILICON |
摘要 |
<p>FET ONE-DEVICE MEMORY CELLS WITH TWO LAYERS OF POLYCRYSTALLINE SILICON Fabricating an integrated circuit array of FET one-device memory cells which includes providing a semisemiconductive substrate of a first conductive type; delineating field insulation regions; delineating polycrystalline silicon gate regions employing an oxidation barrier masking layer; introducing active impurities of a second and opposite conductive type into predetermined regions of the substrate to provide doped bit lines (FET drains), connection regions (FET sources), and lower conductive electrodes of the storage capacitors; next delineating upper poycrystalline silicon electrodes of the storage capacitors; growing silicon dioxide insulation over all portions of the structure except over the FET gate regions which are protected by the oxidation barrier masking layer; removing the oxidation barrier masking layer over the FET gates with an etchant; delineating contact holes to polycrystalline silicon capacitor electrodes and to FET sources and drains in circuits peripheral to the array of memory cells; and delineating the metallic-type high-conduc-tivity electrical interconnection word line pattern.</p> |
申请公布号 |
CA1079866(A) |
申请公布日期 |
1980.06.17 |
申请号 |
CA19770271024 |
申请日期 |
1977.02.03 |
申请人 |
INTERNATIONAL BUSINESS MACHINES CORPORATION |
发明人 |
RIDEOUT, VINCENT L. |
分类号 |
H01L27/10;H01L21/28;H01L21/336;H01L21/82;H01L21/8242;H01L21/8247;H01L27/088;H01L27/108;H01L29/78;H01L29/788;H01L29/792;(IPC1-7):01L21/22;01L29/78;01L21/31 |
主分类号 |
H01L27/10 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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