发明名称 SEMICONDUCTOR INTEGRATED CIRCUIT
摘要 PURPOSE:To prevent an electrostatic breakdown effectively without enlarging an element area by connecting a protecting transistor having a lower base-collector breakdown voltage to a transistor of protected circuit. CONSTITUTION:There is provided in one substrate a protecting transistor having a base-collector breakdown voltage lower than a base-collector breakdown voltage of a transistor of protected circuit, the collector is connected to an input terminal of the protected circuit, the emitter is connected to a reference level terminal and further the base is connected to the reference level terminal through a resistance means. To arrange such, a p-type base region 12 is formed in an n-type layer grown on an n<+>-type collector buried region 18, an n<+>-type emitter region 14 is formed therein and furthr an n<+>-type region 15 to drop the base-collector breakdown voltage is provided in the region 12 to a protecting transistor, which will be connected to the protected circuit.
申请公布号 JPS5580350(A) 申请公布日期 1980.06.17
申请号 JP19780154818 申请日期 1978.12.13
申请人 FUJITSU LTD 发明人 KANAI YASUNORI
分类号 H01L27/04;H01L21/331;H01L21/822;H01L27/02;H01L27/06;H01L29/73;H01L29/74 主分类号 H01L27/04
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