发明名称 DEFECT INSPECTING METHOD
摘要 PURPOSE:To improve the detecting ability principally for a band-shaped defect, etc., by employing an image pickup camera as a camera which has such a innear array image sensor that the longitudinal-lateral shape ratio of one unit element is >=(1:50). CONSTITUTION:The image pickup camera is used as the camera which has the linear image array image sensor 1a whose longitudinal-lateral shape ratio of one unit element 6a is >=(1:50). The image of an element 6a of the sensor 1a corresponds to one unit element equivalent visual field 7 on a running sheet 3 to be inspected. Defects 4 and 5 which are long in a scanning direction are added optically. The accumulation of errors due to electronic addition and a decrease in defect deciding ability are eliminated. Consequently, the detecting ability mainly for the band-shaped defect, etc., is improved.
申请公布号 JPH01216241(A) 申请公布日期 1989.08.30
申请号 JP19880040863 申请日期 1988.02.25
申请人 HIYUUTEC:KK 发明人 MIHARA TOSHIAKI
分类号 G01N21/84;G01N21/89;G01N21/892;H04N5/225;H04N5/335 主分类号 G01N21/84
代理机构 代理人
主权项
地址