发明名称 LOCATION ADJUSTMENT OF LIGHT EMITTING DEVICE
摘要 <p>PURPOSE:To effect the algnment of a light emitting device at high accuracy by measuring the maximum value of an electromotive force with use of a voltmeter and aligning an optical axis of a light emitting device to a required axis when a semiconductor laser is oscillated to emit the beam. CONSTITUTION:One electrode of a semiconductor laser LD3 is connected to one terminal of the voltmeter 21 thuough a mount 4 and the other electrode to the other terminal of the voltmeter 21. The beam from a He-Ne laser 5 is comverged on a ligt emitting surface of LD3 through a lense 20 with a relatively long focus, a pinhole 6 and a hole 2. The central axis of the hole 2 for fitting an optical apparatus corresponds to an optical axis 8. PN-junction structure is formed adjacent to an active area within LD3, and the photovoltaic force is produced when the beam falls on this portion. So when the laser 5 emits the beam, the maximum value of an electromotive force is measured with use of a voltmeter 21, and an optical axis of a light emitting device is aligned to a required axis, so that the positioning is adjusted high accurately.</p>
申请公布号 JPS5558590(A) 申请公布日期 1980.05.01
申请号 JP19780131239 申请日期 1978.10.25
申请人 FUJITSU LTD 发明人 SASAKI MASARU
分类号 H01L21/66;H01L33/30;H01L33/58;H01S5/00 主分类号 H01L21/66
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