| 摘要 |
PURPOSE:To detect easily a faulty register by inverting and shifting out test data and comparing it with a correct solution value after shifting in test data from the external to a shift register. CONSTITUTION:Sequence circuit 1 is set to a shift mode by indication of test control circuit 12. Next, shift control circuit 14 and clock control circuit 18 are operated to shift in data, which should be stored in test pattern storage circuit 13, into register 2 in sequence circuit 1. Next, inversion mode control circuit 20 is operated to invert contents stored in register 2. Updated contents in register 2 are outputted to shift out output comparator circuit 17 and are compared with a correct solution value. |
