发明名称 MANUFACTURING METHOD OF NONVOLATILE SEMICONDUCTOR MEMORY
摘要 PURPOSE:To dispense with providing a space between floating gates and raise the degree of integration, by oxidizing the floating gates insulated by an oxide film, making a polysilicon oxide film and growing a polysilicon at gas phase. CONSTITUTION:A field oxide film 2 is produced on a P-type substrate 1 by a selective oxidation film process. A gate oxide film 3 is then produced. A polysilicon film 4 is grown at gas phase. An impurity is diffused into the film 4 to make this film electroconductive. A part of the film 3 is removed except for only a polysilicon for making alternate cells. A gate oxide film 7 is produced on the substrate 1 and a polysilicon oxide film 8 is produced on the film 4. A polysilicon film 9 is grown on the films 7, 8 and made electroconductive. Unnecessary parts are removed so that the floating gates 4, 9 insulated by the oxide film 8 are provided. The films 4, 9 are oxidized so that a polysilicon oxide film 5 is produced. A polysilicon 6 is grown at gas phase. As a result, a space does not need to be provided between the floating gates and the degree of integration is raised.
申请公布号 JPS5546518(A) 申请公布日期 1980.04.01
申请号 JP19780119206 申请日期 1978.09.29
申请人 TOKYO SHIBAURA ELECTRIC CO 发明人 NOZAWA HIROSHI
分类号 H01L27/112;H01L21/8246;H01L21/8247;H01L29/788;H01L29/792 主分类号 H01L27/112
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