Test site for a charged coupled device (CCD) array

摘要

Disclosed is a test site for an integrated circuit chip including a CCD register. Two serial CCD registers are spaced from each other at incrementally variable intervals. The first register receives a serial bit stream having a first binary value while the second serial register receives a bit stream having a second binary value. Data is transferred in parallel from the second register to determine the point at which the spacing between the two registers is sufficiently close to permit undesirable cross-talk.