发明名称 Method of passivating a semiconductor device utilizing dual polycrystalline layers
摘要 A semiconductor device is surface-passivated by a multi-layer film which includes a base coat of substantially undoped polycrystalline silicon in intimate contact with the substrate and bridging the semiconductor junction. A top coat of polycrystalline silicon is doped with oxygen and disposed overlying the base coat. The method of passivating a semiconductor device includes initial formation of a base layer of substantially undoped polycrystalline silicon from a controlled atmosphere of a silane material. This is advantageously followed by a deposition of oxygen-doped polycrystalline silicon in continuation of the atmosphere of silane material with the added introduction of a gaseous oxygen donor.
申请公布号 US4194934(A) 申请公布日期 1980.03.25
申请号 US19790028836 申请日期 1979.04.10
申请人 VARO SEMICONDUCTOR INC 发明人 BLASKE, THEODORE A;YU, HO Y
分类号 H01L21/314;H01L21/3205;H01L23/31;(IPC1-7):H01L21/20;H01L29/04 主分类号 H01L21/314
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