| 摘要 |
An integrated circuit test system is described including a programmable test fixture controlled by a computer for automatically performing D.C., dynamic, and functional tests on integrated circuit devices to provide 100 measurements per second with a rise time of 1 nanosecond. The test fixture includes a first circuit board on which a plurality of test probes are mounted, a second circuit board connected to such first board by connector pins and having a plurality of different loads, D.C. bias voltage sources, and associated switches mounted thereon for selectively connecting them to active connector terminals connected to the pins of the device under test, and a third circuit board having a socket for such device releasably connected to the load board. A fourth circuit board with loads mounted thereon may be attached to the socket board for testing extremely high speed devices and extends perpendicular through central openings in the other boards. The sampling probes are plugged into sockets on a grounded mounting ring attached to the probe board and extend radially outward from such ring in parallel to such probe board to reduce inductance and require less space. The load board is provided with a plurality of ground terminals positioned between adjacent active connector terminals for further reducing the inductance to ground.
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