Optical image sensor semiconductor apparatus

摘要

The optical intensity pattern of a two-dimensional image field is electrically scanned a line at a time by a shift register access technique, thus providing a first stream of bits for each line. Each of these bits in a given line is compared with a dither coded second stream of bits generated in response to the background illumination (absence of image) along a line immediately adjacent to the line being scanned. The resulting sequence of comparisons is a dither coded signal representation of the line being scanned, which is compensated for nonuniform background illumination of the image field.