发明名称 PARTS INSPECTING DEVICE FOR PRINT SUBSTRATE
摘要 PURPOSE:To make it possible to accomplish the automatic inspections with the use of a simple construction by forming a slit pattern light on a print substrate to make the pattern detecting signals binary so that the existence of the parts may be judged. CONSTITUTION:By the slit light from a slit light projector 6, a slit pattern 6 is formed on a substrate 1, and the reflected lights from the slit patterns according to the existence of the circuit parts 2a of the substrate 1 are received by a photoelectric converting element 8 having a number of subelements. These receives signals are converted into binary signals by a binary circuit 9, which is preset with a threshold value. A parts existence detecting circuit 10 judges that there are the parts 2a, when the number of low level bits is large in the binary signals, so that it memorizes the judged results in its memory. Then, an XY table 5 is controlled through a print substrate analyzing circuit 11 for memorizing the parts positions in the substrate so that similar judgements are repeated.
申请公布号 JPS5530659(A) 申请公布日期 1980.03.04
申请号 JP19780104000 申请日期 1978.08.25
申请人 MITSUBISHI ELECTRIC CORP 发明人 INOUE TAKESHI
分类号 G01N21/88;G01N21/956;G01R31/28;G01V8/10 主分类号 G01N21/88
代理机构 代理人
主权项
地址