发明名称 Making semiconductor structure with improved phosphosilicate glass isolation
摘要 In a field effect device such as a charge coupled device or field effect transistor in which at least two levels of polycrystalline silicon conductors are used; these two levels of polycrystalline silicon are isolated from one another with a dielectric layer. Disclosed is a dielectric layer of reflowed phosphosilicate glass (PSG) on top surfaces of a polycrystalline silicon layer which may be doped by phosphorous impurities diffusing from the PSG.
申请公布号 US4191603(A) 申请公布日期 1980.03.04
申请号 US19780901901 申请日期 1978.05.01
申请人 INTERNATIONAL BUSINESS MACHINES CORP 发明人 GARBARINO, PAUL L;REVITZ, MARTIN;SHEPARD, JOSEPH F
分类号 H01L29/78;H01L21/3105;H01L21/321;H01L21/339;H01L21/8234;H01L29/762;(IPC1-7):H01L21/22 主分类号 H01L29/78
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