发明名称 SEMICONDUCTOR DEVICE MANUFACTURING METHOD
摘要 PURPOSE:To easily realize low-power consumption and high-speed IIL by providing a gradient for the impurity concentration of the base region of a horizontal-type transistor Tr from the neighborhood of the emitter so as to facilitate the carrier diffusion. CONSTITUTION:N-type semiconductor layer 2 is grown on N<+>-type base, and its surface is covered with Si oxide film 15 and Si nitride film 16. Windows 17 and 18 are formed on the region where emitter 3 and collector 4 of a horizontal type PNP Tr are to be formed by removing films 15 and 16. Then, Si oxide film 19 is formed and window 20 is provided. By this, P is diffused and base 13 of high N<+> concentration is formed. On top of this, film 19 is grown. Next, by removing film 19, P-type impurity is introduced from windows 17 and 18, and thereby No.1 and No.2 N<+>-type regions 3 and 4 are formed. Then, by selective diffusion, No.1 and No.2 N<+>-type regions 3 and 4 are formed inside No.2 P-type region, and then power source terminal 7, input terminal 8 and No.1 and No.2 output terminals 9 and 10 are provided.
申请公布号 JPS5527617(A) 申请公布日期 1980.02.27
申请号 JP19780100556 申请日期 1978.08.17
申请人 MITSUBISHI ELECTRIC CORP 发明人 SAIKAI HIROSHI
分类号 H01L27/082;H01L21/331;H01L21/8226;H01L27/02;H01L29/73;H03K19/091 主分类号 H01L27/082
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