发明名称 |
Ion implantation doping of semiconductor - for diode, transistor or solar cell prodn. using simultaneous doping at front and back |
摘要 |
<p>In a semiconductor doping process by ion implantation, several implantation processes are carried out simultaneously pref. >=1 on the front and >=1 on the back. Specifically a diode with a highly doped back contact is produced by implantation of ions of a pentavalent element into the front and a trivalent element into the back of a p-Si semiconductor or of a hexavalent element into the front and a divalent element into the back of p-GaAs. At least 2 different types of ions can be implanted simultaneously on the same side, e.g.-ions of 2 pentavalent elements into the front of p-Si or 2 trivalent elements into the front of n-Si. Process is used specifically for the mfr. of a pn-junction (diode) or transistor and esp. solar cells. Complete semiconductor structures can be doped quickly and economically in a single stage.</p> |
申请公布号 |
DE2835121(A1) |
申请公布日期 |
1980.02.14 |
申请号 |
DE19782835121 |
申请日期 |
1978.08.10 |
申请人 |
FRAUNHOFER-GESELLSCHAFT ZUR FOERDERUNG DER ANGEWANDTEN FORSCHUNG E.V. |
发明人 |
RYSSEL,HEINER,DR.-ING. |
分类号 |
H01J37/317;H01L21/265;H01L31/18;(IPC1-7):01L21/265;01L31/04 |
主分类号 |
H01J37/317 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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