CALIBRATIOB SYSTEM FOR SPECTROSCOPES

摘要

Apparatus for calibrating a slit width in a calibration system for spectroscopes. In conventional calibration systems, there has been a problem of no provision of slit width calibration function, though the precision of the slit width of spectroscopes is one of the important factors for its performance. In this invention, the bright line spectrum or the zero-order ray is utilized to calibrate the slit width. A peak value of the output signals from a photosensor (20) is detected by means of a peak discriminator (26), and the peak value is stored in a memory (28). The peak value is compared with the output of the photosensor (20) in a comparator (32). The slit width calibration may be performed on the basis of the amount of wave length scanning at which amount the peak value and the output of the photosensor are brought up to the coincidence with each other.