| 摘要 |
The invention relates to a method and apparatus for evaluating non-homogenous material having a high dielectric element by sensing the conductance and/or capacitance properties of a material (60,S) by passing it between a pair of plates (74, 76; 102, 104) which form part of a capacitance responsive electrical network. An A.C. voltage is applied across the plates (74, 76; 102, 104) at a frequency which prior tests have indicated will produce a given conductance or capacitance reading for a material of interest. |
