| 摘要 |
<p>Output gate electrode structure between the storage matrix and the output register of a serial-parallel-serial (SPS) charge coupled device (CCD) memory. To permit high channel packing density in the matrix, the output register can have as few as M/N stages, where M is the number of channels in the matrix and N the number of phases employed for operating the register, The gate structure transfers 1/N'th of a word at a time to the output register and while this 1/N'th of a word is being propagated out of the register, the remaining part (or parts), if any, of the word are stored while the gate structure provides a potential barrier between this stored charge and the register.</p> |
