发明名称 Linear flaw detector
摘要 A linear flaw detector for coated surfaces. An incident beam is provided and sensed above and below the theoretical specular angle. Where a flaw occurs, the reflected signal changes in intensity. By sensing above and below the specular angle, the signal corresponding to the flaw is accented in reference to the signals from the background. The signal corresponding to the flaw may then be separated from background noise and an output provided.
申请公布号 US4184082(A) 申请公布日期 1980.01.15
申请号 US19780947518 申请日期 1978.10.02
申请人 HOWELL LABS INC 发明人 PEOPLES, PATRICK J
分类号 G01N21/89;(IPC1-7):G01N21/32 主分类号 G01N21/89
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