发明名称 ABNORMALITY DETECTOR FOR CONTROL INSTRUMENT
摘要 <p>PURPOSE:To present an abnormality detector for a control instrument which quickly and accurately detects the abnormality of the control instrument. CONSTITUTION:A deviation E between a set value SV of the control instrument and an actual state value PV is integrated, and an obtained integral value S is compared with a preliminarily set decided value D to detect the abnormality. Simultaneously, the stability against variance and the quickness of detection are secured by check of the change of the set value SV, check of the increase/ reduction of the deviation E, and comparison of an absolute value ¦E X S¦.</p>
申请公布号 JPH04218809(A) 申请公布日期 1992.08.10
申请号 JP19910080844 申请日期 1991.03.18
申请人 IDEMITSU KOSAN CO LTD;MITSUBISHI HEAVY IND LTD 发明人 KASEDA SHIGERU;TAKAHASHI KOICHI;ARAYA TOSHIHIKO;FUNAKOSHI RYOHEI
分类号 G05B23/02 主分类号 G05B23/02
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