发明名称 QUALITY MEASUREMENT METHOD OF JEWEL AND THE LIKE
摘要 PURPOSE:To make quality measurement sure by displaying pattern groups of the specific shapes in the field of observation of the specimen. CONSTITUTION:A transparent glass plate 1 displaying the pattern groups 2 each of the shape comprising drawing an inner circle of a diameter R and an outer circle having a diameter of 2<1/2>R in concentrical circle form and smearing out the section between the inner and outer circles of each 45 deg. portion of the arc to make observation easy is disposed below the eyepiece 7 in the lens-barrel 5 of a microscope. After correction of magnifications has been done, a jewel or the like 10 being the specimen is placed on a stage 9 and is observed from the direction where it is normally appreciated. Within the field of observation, the defect image in the jewel or the like 10 and the pattern groups 2 are simultaneously observed and the defect image is contrasted with the pattern of exactly the same size as that of the image, whereby the length of the defect image is judged. Thereby, the defects in the jewel or the like 10 may be displayed by correct numerical values as areas and the intended object may be achieved.
申请公布号 JPS554504(A) 申请公布日期 1980.01.14
申请号 JP19780075964 申请日期 1978.06.24
申请人 OKUDA HOUSEKI GIKEN KK 发明人 OKUDA KAZUMI
分类号 G02B21/36;G01N21/87;G02B27/00 主分类号 G02B21/36
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