发明名称 TEST DEVICE FOR LOGIC CIRCUIT
摘要 PURPOSE:To ensure an easy test for the logic circuit including the register file by writing the test result given from the combination circuit into all registers of the register file at one time and then comparing the output value with the correct value. CONSTITUTION:Register file 2 consists of plural units of the shift register and stores the test data into the registers at one time for the test of the logic circuit. And the data given from file 2 is given to combination circuit 3 along with the output of register 1. Then the test result given from circuit 3 is written into all registers of file 2 at one time, and the value of register 1 and file 2 delivered from shift data output line 14 is compared with the correct value. As a result, the test can be given easily to the logic circuit including the register file.
申请公布号 JPS554684(A) 申请公布日期 1980.01.14
申请号 JP19780078403 申请日期 1978.06.27
申请人 NIPPON ELECTRIC CO 发明人 MORISUE HIDEO
分类号 G01R31/28;G06F11/00;G06F11/22 主分类号 G01R31/28
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