发明名称 XXRAY SPECTROMETER
摘要 An X-ray spectrometer which is arranged inside an evacuatable housing and which comprises a wavelength dependent X-ray detection system and, for irradiating the specimen to be examined, an electron source with an electron deflection system for generating an electron beam and an X-ray source for generating an X-ray beam. The X-ray source consists of an anticathode on which the electron beam can be directed by the electron deflection system in order to generate the X-ray beam.
申请公布号 JPS551593(A) 申请公布日期 1980.01.08
申请号 JP19790073447 申请日期 1979.06.11
申请人 PHILIPS NV 发明人 HERUMUTO BIRUHERUMU BERUNAA BE;BIRUHERUMUSU FURANSHISUKASU KU;ANTONIUSU BIRUHERUMUSU BITOMER
分类号 G01N23/225;G01N23/22;G01N23/223;G21K1/06;H01J35/04;H01J35/14;H01J37/16;H01J37/252 主分类号 G01N23/225
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