发明名称 METHOD OF MANUFACTURING A SEMICONDUCTOR DEVICE HAVING SHALLOW TRENCH ISOLATION
摘要 A method of manufacturing semiconductor device, in which trenches (7) are formed in a surface (2) of a silicon body (1), which trenches are filled with silicon oxide (11). The filled trenches are used as field-oxide regions (12) in integrated circuits. The silicon oxide is deposited from a gas phase and is subsequently densified by means of a thermal treatment in an NO or N2O-containing atmosphere. The deposited silicon oxide can be densified in a very short period of time, and, in addition, the thermal treatment does not cause crystal defects. The method can suitably be used for "single wafer processing".
申请公布号 WO9845877(A1) 申请公布日期 1998.10.15
申请号 WO1998IB00281 申请日期 1998.03.05
申请人 KONINKLIJKE PHILIPS ELECTRONICS N.V.;PHILIPS NORDEN AB 发明人 WOERLEE, PIERRE, HERMANUS
分类号 H01L21/31;H01L21/316;H01L21/76;H01L21/762 主分类号 H01L21/31
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