发明名称 |
METHOD OF MANUFACTURING A SEMICONDUCTOR DEVICE HAVING SHALLOW TRENCH ISOLATION |
摘要 |
A method of manufacturing semiconductor device, in which trenches (7) are formed in a surface (2) of a silicon body (1), which trenches are filled with silicon oxide (11). The filled trenches are used as field-oxide regions (12) in integrated circuits. The silicon oxide is deposited from a gas phase and is subsequently densified by means of a thermal treatment in an NO or N2O-containing atmosphere. The deposited silicon oxide can be densified in a very short period of time, and, in addition, the thermal treatment does not cause crystal defects. The method can suitably be used for "single wafer processing". |
申请公布号 |
WO9845877(A1) |
申请公布日期 |
1998.10.15 |
申请号 |
WO1998IB00281 |
申请日期 |
1998.03.05 |
申请人 |
KONINKLIJKE PHILIPS ELECTRONICS N.V.;PHILIPS NORDEN AB |
发明人 |
WOERLEE, PIERRE, HERMANUS |
分类号 |
H01L21/31;H01L21/316;H01L21/76;H01L21/762 |
主分类号 |
H01L21/31 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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