发明名称 MANUFACTURE OF THIN-FILM TRANSISTOR
摘要 <p>PROBLEM TO BE SOLVED: To manufacture a thin-film transistor with high-speed operation and superior reproducibility, by forming source and drain regions by selectively applying a laser beam for promoting crystallization, and by setting the part to the channel part of a thin-film transistor in a low-resistance non-single crystal semiconductor with a conduction type of an N- or P-type. SOLUTION: Soda glass is used, where the soda glass has an ITO (pixel) electrode 18 being subjected to patterning as a transparent conductive film on a substrate 11. On the substrate 11, an I-type non-single crystal silicon film 13 is formed as a high-resistance semiconductor layer by the plasma CVD method. In the same manner, a single crystal silicon film 12 of an N-type conduction type is formed as a low-resistance non-single semiconductor. In the same manner, a non-single crystal silicon film 12 of an N-type conduction type is formed as the low-resistance non-single semiconductor. The non-single crystal silicon films 12 and 13 are masked to the specific external form pattern of source and drain regions and are subjected to dry etching by a CF4 gas. Then, a molybdenum thin film is formed by sputtering, the source and a drain electrodes 50 and 51 are set by etching, and a thin-film transistor 10 is arranged on the substrate.</p>
申请公布号 JPH11251602(A) 申请公布日期 1999.09.17
申请号 JP19980333243 申请日期 1998.11.24
申请人 SEMICONDUCTOR ENERGY LAB CO LTD 发明人 KODAMA MITSUFUMI;KINKA MIKIO
分类号 G02F1/136;G02F1/1368;H01L21/20;H01L21/336;H01L29/786;(IPC1-7):H01L29/786 主分类号 G02F1/136
代理机构 代理人
主权项
地址