| 摘要 |
A method for the repairing of defective elements of a memory in integrated circuit form, comprising redundant elements to replace defective elements, consists of the following steps: A) For each defective element detected: searching for a first non-defective redundant element by the testing of the redundant elements; assigning this first redundant element to the defective element. B) When the assigning of a redundant element to each defective element has been achieved, replacing each defective element by the assigned redundant element.
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