发明名称 TEST CIRCUITRY OF AN INTEGRATED CIRCUIT COMPRISING ONLY ONE SELECTION ELEMENT FOR EACH SIGNAL PATH
摘要 <p>An integrated circuit according to the invention comprises at least a first and a second circuit (1,2 resp.) and a first and a second signal path (10-20 and 11-21 resp.) between the first and the second circuit. The first and the second signal path each comprise a selection element (30) which has a first input (30a, 31a) coupled to the first circuit (1), and a second input (30b, 31b). The selection element (30) has an output (30c, 31c) coupled to the second circuit (2). The second input (31b) of the selection element (31) of the second signal path (11-21) is coupled to a memory element (41). The output (40a) of the selection element (30) of the first signal path (10-20) is coupled to an input (40a) of the memory element (40).</p>
申请公布号 WO2002063321(A2) 申请公布日期 2002.08.15
申请号 IB2002000090 申请日期 2002.01.14
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