首页
产品
黄页
商标
征信
会员服务
注册
登录
全部
|
企业名
|
法人/股东/高管
|
品牌/产品
|
地址
|
经营范围
发明名称
METHOD OF AND DEVICE FOR MEASURING LENGTH OF VARIABLE WAVELENGTH INTERFERANCE TYPE
摘要
申请公布号
JPS54151864(A)
申请公布日期
1979.11.29
申请号
JP19780061395
申请日期
1978.05.22
申请人
WAKEJIMA TAKU
发明人
WAKEJIMA TAKU
分类号
G01B11/00;G01B11/02
主分类号
G01B11/00
代理机构
代理人
主权项
地址
您可能感兴趣的专利
Call optimization in ad-hoc conference calls
System and method for managing postal induction, tracking, and delivery
Multi-channel undulative induction accelerator
Strain balanced nitride heterojunction transistors
Low voltage to extra high voltage level shifter and related methods
Method for generating electric power and electric battery
Method and apparatus for increasing the device count on a single ATA bus
Method of providing a wireless service connection for a mobile vehicle
Method and apparatus for laser removal of hair
Multicolor ink jet printing method and printer
Apparatus and method for reducing the risk of decubitus ulcers
System and method for determining segment and link bandwidth capacities
Apparatus, system, and method for indicating a level of network activity
Heterocyclic compounds having antibacterial activity: process for their preparation and pharmaceutical compositions containing them
Semiconductor wiring substrate, semiconductor device, method for testing semiconductor device, and method for mounting semiconductor device
Concatenated forward error correction decoder
OO control for injection molding machine
Method and apparatus for controlling temperature of infused liquids
Image forming apparatus using image data and identification information in relation to an output apparatus
Variable drive current driver circuit