SEMICONDUCTOR MEMORY DEVICE AND METHOD OF SETTING TEST MODE USING ADDRESS PINS

摘要

A semiconductor memory test apparatus of setting a test mode using an address pin is provided to change a test pattern condition by changing a value of the address pin without entering an MRS(Mode Resistor Set) mode. A mode setting register sets the state of a code and a parallel bit test signal according to a mode setting register code applied from the outside in response to a mode setting command. At least one address pin is used for changing a test mode. A mode combination part combines a test mode address value determined by the value of the address pin and the mode setting register value. A test pattern circuit determines a test mode according to the combination result of the mode combination part.