TEST DEVICE FOR IC LEAD BEND,申请号JP19780059579-传众专利搜索

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发明名称	TEST DEVICE FOR IC LEAD BEND
摘要
申请公布号	JPS54150089(A)	申请公布日期	1979.11.24
申请号	JP19780059579	申请日期	1978.05.18
申请人	NIPPON ELECTRIC CO	发明人	YAMADA SHIGE;NARUSE MASAYUKI
分类号	G01R31/26;G01B11/00;G01B11/24;H01L21/66	主分类号	G01R31/26
代理机构		代理人
主权项
地址

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