| 发明名称 |
SEMICONDUCTOR TEST SYSTEM CAPABLE OF VIRTUAL TEST AND SEMICONDUCTOR TEST METHOD THEREOF |
| 摘要 |
A semiconductor test system capable of performing a virtual test and a semiconductor test method thereof. The semiconductor test system includes a tester providing a test signal and an emulator providing a virtual test result to the tester in response to the test signal. The emulator includes virtual prober software to obtain the virtual test result.
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| 申请公布号 |
US2008068036(A1) |
申请公布日期 |
2008.03.20 |
| 申请号 |
US20070756860 |
申请日期 |
2007.06.01 |
| 申请人 |
YUN BYONG-HUI;SEO KI-MYUNG;BYUN DO-HOON |
发明人 |
YUN BYONG-HUI;SEO KI-MYUNG;BYUN DO-HOON |
| 分类号 |
G01R31/02;G01R31/28;H01L21/66 |
主分类号 |
G01R31/02 |
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