| 摘要 |
An X-ray interferometer comprises a plane film of material of low X-ray absorption coefficient, a first surface facing one side of the film, and a second surface facing the other side of the film and substantially opposite the first surface, the first and second surfaces being of high X-ray absorption coefficient and being relatively inclined at a small angle, arranged so that when a beam of X-rays is incident on the film at a glancing angle in the plane in which the small angle of relative inclination lies, a first part of the incident beam is, in sequence, transmitted by the film, reflected by the first surface, and reflected by the film as a first partial beam, and a second part of the incident beam is, in sequence, reflected by the film, reflected by the second surface, and transmitted by the film as a second partial beam which intersects the first partial beam.
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