发明名称 Semiconductor memory devices and methods of fabricating the same
摘要 A semiconductor memory device may include stacks arranged in a first direction and vertical channel structures provided through the stacks. Each of the stacks may include gate electrodes and insulating layers alternately stacked on a substrate. Each of the vertical channel structures may include a semiconductor pattern connected to the substrate and a vertical channel pattern connected to the semiconductor pattern. Each of the semiconductor patterns may have a recessed sidewall, and the semiconductor patterns may have minimum widths different from each other.
申请公布号 US9373635(B2) 申请公布日期 2016.06.21
申请号 US201514801430 申请日期 2015.07.16
申请人 Samsung Electronics Co., Ltd. 发明人 Jung Won-Seok;Kim Youngok;Kim Jihye;Joo Kyungjoong
分类号 H01L27/115;H01L23/535;H01L29/51;H01L29/423;H01L27/06 主分类号 H01L27/115
代理机构 Myers Bigel & Sibley, P.A. 代理人 Myers Bigel & Sibley, P.A.
主权项 1. A semiconductor memory device, comprising: stacks separated from each other in a first direction by a trench, each of the stacks comprising insulating layers and gate electrodes alternately and repeatedly stacked on a substrate; first and second semiconductor patterns arranged along the first direction, each of the first and second semiconductor patterns being inserted in a lower portion of each of the stacks and being connected to the substrate; first and second vertical channel patterns in each of the stacks on the respective first and second semiconductor patterns; and a common source plug in the trench, wherein the first semiconductor pattern is closer to the trench than the second semiconductor pattern, and wherein a minimum width of the first semiconductor pattern is less than that of the second semiconductor pattern.
地址 KR
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