发明名称 |
Fail=safe logic with AND=gate and memory - produces programmed signal whose delayed delay time is only shortened if component fails |
摘要 |
<p>The logic circuit produces a programmed signal with delayed decay time. It is designed so that if a component fails the delayed decay time is only shortened or disappears. A fail-safe AND-gate and a fail-safe memory are connected together such that the input of the AND-gate that receives the input signal is connected to one input of the memory. The output of the memory is fed back to that input of the AND-gate that receives the clock pulses. The AND-gate output is connected via a growth OR-gate to the growth input of the memory. Both the AND-gate and the memory have capacitors to maintain a time-limited control potential.</p> |
申请公布号 |
DE2817680(A1) |
申请公布日期 |
1979.10.31 |
申请号 |
DE19782817680 |
申请日期 |
1978.04.20 |
申请人 |
LICENTIA PATENT-VERWALTUNGS-GMBH |
发明人 |
LUDWIG,DIPL.-ING. DUEMMEN,PAUL;LOTZ,ALFRED,ING. |
分类号 |
H03K19/007;(IPC1-7):H03K19/00 |
主分类号 |
H03K19/007 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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