发明名称 Fail=safe logic with AND=gate and memory - produces programmed signal whose delayed delay time is only shortened if component fails
摘要 <p>The logic circuit produces a programmed signal with delayed decay time. It is designed so that if a component fails the delayed decay time is only shortened or disappears. A fail-safe AND-gate and a fail-safe memory are connected together such that the input of the AND-gate that receives the input signal is connected to one input of the memory. The output of the memory is fed back to that input of the AND-gate that receives the clock pulses. The AND-gate output is connected via a growth OR-gate to the growth input of the memory. Both the AND-gate and the memory have capacitors to maintain a time-limited control potential.</p>
申请公布号 DE2817680(A1) 申请公布日期 1979.10.31
申请号 DE19782817680 申请日期 1978.04.20
申请人 LICENTIA PATENT-VERWALTUNGS-GMBH 发明人 LUDWIG,DIPL.-ING. DUEMMEN,PAUL;LOTZ,ALFRED,ING.
分类号 H03K19/007;(IPC1-7):H03K19/00 主分类号 H03K19/007
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