发明名称 Automatic analyzer
摘要 Abnormality causes are automatically identified during daily quality control, based on the focused consideration of complex uncertainty factors and, especially, of the causes of device-side abnormalities, the latter of which are often difficult to identify. The analyzer performance that affects measurement results can be estimated from analysis parameters and calibration results. Thus, uncertainty estimates are automatically calculated for each analysis item during quality control, and the estimates are compared with uncertainties obtained during actual QC sample measurement, thereby monitoring and evaluating the analyzer performance. Also, measurements are performed on QC samples of multiple concentrations that contain substances known to subject to particular influences such as those of the optical system, sample dispenser, and reagent dispenser, so that the causes of abnormalities can be identified. Uncertainty estimates calculated from the parameters set for the analysis items are compared with uncertainties obtained from the QC sample measurements.
申请公布号 US9383376(B2) 申请公布日期 2016.07.05
申请号 US200913133655 申请日期 2009.11.11
申请人 Hitachi High-Technologies Corporation 发明人 Kamihara Kumiko;Mimura Tomonori
分类号 G06F17/18;G01N35/00 主分类号 G06F17/18
代理机构 Miles & Stockbridge, P.C. 代理人 Miles & Stockbridge, P.C.
主权项 1. An automatic analyzer, comprising: a plurality of analyzer components, including: an optical system including a light source,a reagent dispenser to dispense a reagent, anda sample dispenser, including a sample probe, to dispense a plurality of quality control (QC) samples; a detector that outputs sample measurement data; a storage unit that stores the sample measurement data and uncertainty data for the plurality of analyzer components; a calculator that calculates an estimated combined uncertainty for each of a plurality of analysis items based on the uncertainty data, and calculates a measured combined uncertainty for each of the plurality of analysis items based on QC sample measurement data; a judgment unit that detects analyzer component abnormalities by: comparing the measured combined uncertainty with the estimated combined uncertainty for each analysis item, and, when the measured combined uncertainty exceeds the estimated combined uncertainty for a particular analysis item, identifying an abnormality associated with one of the plurality of analyzer components; and a display unit to display the abnormality, wherein, after the display unit displays the abnormality, the analyzer component associated with the identified abnormality is replaced, including: replacing the light source when the identified abnormality is an optical system abnormality,replacing the reagent when the identified abnormality is a reagent abnormality,replacing the sample probe when the identified abnormality is a sample dispenser abnormality, orreplacing the QC sample when the identified abnormality is a QC sample abnormality.
地址 Tokyo JP