| 摘要 |
Among other things, a radiation system configured to examine an object is provided. The radiation system comprises, among other things, a radiation source, a detector array, and an object support. The object support is configured to rotate an object and to translate the object during the examination to facilitate acquiring volumetric data indicative of the object. In some embodiments, the detector array comprises a single row of detector cells and the radiation source emits fan-beam radiation. In some embodiments, the radiation system further comprises an image generator configured to generate an image of a surface of the object based upon first data corresponding to a first ray having a first trajectory and intersecting a first location within the object and second data corresponding to a second ray having a second trajectory and intersecting the first location within the object. |
| 主权项 |
1. A radiation system, comprising:
a radiation source configured to emit radiation into an examination region wherein an object is exposed to the radiation during an examination; a detector array configured to detect radiation that traverses the examination region; and an object support configured to rotate the object about an axis of rotation and to translate the object relative to the detector array such that first data, indicative of a first ray of radiation having a first trajectory and intersecting a first location within the object, and second data, indicative of a second ray of radiation ray having a second trajectory and intersecting the first location within the object, is yielded from the examination. |
