发明名称 APPARATUS FOR MEASURING INDUCED POTENTIAL
摘要 PURPOSE:To eliminate an increase in a measuring time and to reduce the load on an examinee by analyzing the relation between induced potential and subject quantity from the characteristic parameter of induced potential outputted from an induced potential analyzing means and the subjective quantity relating to the content of the character row outputted from a subjective quantity data analyzing means. CONSTITUTION:An examinee 10 inputs the result of subjective judgement to the character row displayed by a character row display part 11 to a subjective quantity input part 20 and a signal 201 relating to subjective quantity is collected to a subjective quantity data collection part 21. A subjective data analytical part 22 analyzes how to feel the content of the character row on the basis of the signal 133 relating to the display order of the character row outputted from a character row display control part 13 and the signal 211 showing the numerical value corresponding to the category indicated in relation to the judgement of the examinee to the content of the character row. An objective quantity/subjective quantity relation analytical part 23 analyzes the relation between objective quantity and subjective quantity on the basis of the signal 171 relating to the objective quantity data outputted from an induced potential analytical part 17 and the signal 221 relating to the subjective quantity data outputted from the subjective quantity data analytical part 22.
申请公布号 JPH021233(A) 申请公布日期 1990.01.05
申请号 JP19880142293 申请日期 1988.06.08
申请人 NEC CORP 发明人 YAMAZAKI TOSHIMASA
分类号 A61B5/0484;A61B5/04 主分类号 A61B5/0484
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