发明名称 WHITE XXRAY STRESS MEASURING APPARATUS
摘要 PURPOSE:To measure the energy of scattering X-rays by Compton-scattering gamma rays into the radiation route or gamma rays from isotope to radiation port. CONSTITUTION:A reflector 15 is made of, e.g., lead, and its focus is formed on the curved face which is on the line connecting Soller slits 13 and isotope 8 and aligns to the isotope 8. Hence, the incident angle of the gamma rays radiated from the isotope 8 to the foregoing reflector 15 becomes no longer constant and therefore the gamma rays become the X rays to create parallel beams heading toward the Soller slit 13 side after Compton scattering and the X rays become the ones which have been turned to white X-rays by assuming various energy values. And the X rays are perfectly paralleled by the Soller slits 13 and will then be radiated to the measuring object T.
申请公布号 JPS54122176(A) 申请公布日期 1979.09.21
申请号 JP19780029253 申请日期 1978.03.16
申请人 HITACHI LTD 发明人 KUSUMOTO AKIRA;FUKUDA YOSHIO;NEMOTO SADAO;SAKURAMA NAOKI
分类号 G01N23/207;G01L1/00;G21G4/04;H01J35/00 主分类号 G01N23/207
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