| 摘要 |
PURPOSE:To make unnecessary the normal response data and failure dictionary for failure diagnosis, by giving the failure latch separation function and the failure location indicating function to the center. CONSTITUTION:If an error is detected at the diagnosed unit 1 at site, the diagnosis processor inputs the test data present at the data file 3 to this. The result separates the failure cycle by being informed to the failure cycle separation function 9 via the failure function separation function 8. Next, the inside condition scan out and transfer function 10 reads the failure cycle and the operation data cycle before the failure cycle inputted to the diagnosed unit 1 and feeds them to the center unit 6, where normal response simulation 12 is made with the two data delivered and the circuit information 6 and it is compared with the condition at failure cycle fed from the site and the failure latch is separated 13. Further, after circuit is split by the partition function 14, the failure location is pointed out with the failure location indicating function 15. |
