发明名称 |
Apparatus for marking identification symbols on wafer |
摘要 |
An apparatus for marking identification symbols on a wafer including: a marking means for marking identification symbols on the wafer; a reading means for reading the marked identification symbols; a comparing means for comparing data of the identification symbols which are read by the reading means with basic data on which the identification symbols are marked on the wafer, and a judging means for inspecting and judging from a result of the comparison whether the desired identification symbols are marked on the wafer or not.
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申请公布号 |
US4166574(A) |
申请公布日期 |
1979.09.04 |
申请号 |
US19780911234 |
申请日期 |
1978.05.31 |
申请人 |
TOKYO SHIBAURA ELECTRIC CO LTD |
发明人 |
YOKOYAMA, MASANORI |
分类号 |
B28D5/00;B28D5/04;G06K1/12;H01L23/544;(IPC1-7):G06K17/00;B01J17/00;G06K19/06;G06K7/14 |
主分类号 |
B28D5/00 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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