发明名称 |
Binary patterned web inspection |
摘要 |
An electro-optical inspection system for a binary patterned web which automatically determines registration and the quality of subjects of inspection by comparison with a master pattern stored in the memory of a computer and then passes or rejects individual subjects of inspection depending on the outcome of the comparison effected.
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申请公布号 |
US4166541(A) |
申请公布日期 |
1979.09.04 |
申请号 |
US19770829248 |
申请日期 |
1977.08.30 |
申请人 |
DU PONT DE NEMOURS, E I & |
发明人 |
SMITH, EDMUND H JR |
分类号 |
G06T7/00;(IPC1-7):B07C5/00 |
主分类号 |
G06T7/00 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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