发明名称 Binary patterned web inspection
摘要 An electro-optical inspection system for a binary patterned web which automatically determines registration and the quality of subjects of inspection by comparison with a master pattern stored in the memory of a computer and then passes or rejects individual subjects of inspection depending on the outcome of the comparison effected.
申请公布号 US4166541(A) 申请公布日期 1979.09.04
申请号 US19770829248 申请日期 1977.08.30
申请人 DU PONT DE NEMOURS, E I & 发明人 SMITH, EDMUND H JR
分类号 G06T7/00;(IPC1-7):B07C5/00 主分类号 G06T7/00
代理机构 代理人
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