| 摘要 |
PURPOSE:To make it possible to execute extremely-effective tests by obtaining the constitution which allows tests with a memory circuit part and arithmetic part separated mutually. CONSTITUTION:The semiconductor device consists of memory circuit part 1, arithmetic part 2, selector circuit 6, 1st and 2nd data input ports 3 and 4, and data output port 5. Because of the constitution like this, the data path is formed which inputs data to circuit part 1 from port 3 and outputs data from port 5, so that an ordinary memory tester can make a test by itself. In addition, data are inputted from ports 3 and 4 to arithmetic part 2 and outputted from port 5, so that the test of arithmetic part 2 can be exercised while disconnected from circuit part 1. |
